냅슨코리아 썸네일형 리스트형 캐리어 라이프타임측정기 (Ingot lifetime tester) 제품코드G050146판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Measuring range : 50μS~20mS - Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS code) - Bulk sizes : Contact us in details 상세설명- Minority carrier lifetime tester for silicon Ingot (잉곳 소수 캐리어 수명 측정장치) - JIS direct current anodizing method - Photoconductive decay method - Global standard model for the l.. 더보기 Semi-suto Rs/Res. measurement 제품코드G050145판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Rs : 0.01~3000 Ω/sq - Applications : Conductive layers on glass or film - Sample sizes : Contact us in details 상세설명- Automatically measures sheet resistance - For ITO, metal and conductive layers on film or glass - Easy operation with PC - System is designed for small footprint in clean room - Non-contact Eddy curre.. 더보기 Semi-auto Rs/Res. measurement system 제품코드G050144판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Rs:5.0mΩ/sq~10.0MΩ/sq - Res:1.0mΩ?cm ~300kΩ?cm ( t=100~2000μm ) - Applications : Silicon wafer, conductive layer on glass/film and more - Sample size : 2"~8"Ф, max.156mmSQ 상세설명- All-in-one instrument of resistivity tester and measuring stage (Small foot print) - Without PC operation (stand-alone use) or PC operate s.. 더보기 Manual Rs/Res. measurement system 제품코드G050142판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징-Res : 10μ~100k?Ωcm -Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc) Conductive thin film (Metal, ITO etc) Others (*Please contact us for details) -Sample sizes : φ10mm or 5mmX10mm~35mmX35mm or others 상세설명- Controlled Thermo-chuck (room temperature～600℃/less than 20 minutes.. 더보기 Wafer 두께측정기 제품코드G050141판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징-Thickness : 200 ?1200μm / Bow : +/-350μm / Warp : 350μm - Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc) Silicon-related epitaxial materials, Ion-implantation sample Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc) - Sample sizes : 3~8 inch 상세설명- Measures .. 더보기 이전 1 다음